发明名称 PHOTOMASK AND ITS MANUFACTURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a photomask with which lithography with high accuracy can be performed while suppressing increase in cost, and to provide a method for manufacturing the photomask. <P>SOLUTION: The photomask consists of a transparent substrate 1 as a first transparent substrate and transparent substrates 2, 3, 4 as a plurality of second transparent substrates opposing to the transparent substrate 1 and detachably attached to the transparent substrate 1, the second substrates having respective light shielding patterns 5, 6, 7 different from one another. A specified light shielding pattern is produced by combining the light shielding patterns 5, 6, 7 formed in the transparent substrates 2, 3, 4. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005003950(A) 申请公布日期 2005.01.06
申请号 JP20030167544 申请日期 2003.06.12
申请人 RENESAS TECHNOLOGY CORP 发明人 KAMON KAZUYA
分类号 G03F1/60;H01L21/027;(IPC1-7):G03F1/14 主分类号 G03F1/60
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