发明名称 |
Defect inspection apparatus |
摘要 |
A defect inspection apparatus for inspecting an object to be inspected for a defect by processing an image taken from the object, includes: neural networks provided respectively for individual defect types to be classified; a learning unit which makes the neural networks learn based on the corresponding defect types to be classified; and a defect detection unit which classifies and detects defect types using the neural networks that have learned.
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申请公布号 |
US2005002560(A1) |
申请公布日期 |
2005.01.06 |
申请号 |
US20040855320 |
申请日期 |
2004.05.28 |
申请人 |
NIDEK CO., LTD. |
发明人 |
YAMAMOTO TAKAYASU;YONEZAWA EIJI;UMEZAKI TAIZO |
分类号 |
G06K9/00;G06K9/62;G06K9/66;G06T7/00;(IPC1-7):G06K9/62 |
主分类号 |
G06K9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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