发明名称 Generation of a testbench for a representation of a device
摘要 A system and method for generating a testbench for a representation of a device to be incorporated in a data processing apparatus is provided. The representation of the device is configurable based on configuration data specifying predetermined attributes of one or more components of the data processing apparatus with which that device is to be coupled, and the testbench provides a test environment that represents those one or more components. The method comprises the steps of receiving the configuration data used to configure the representation of the device, and generating the testbench with reference to the configuration data and a first set of templates defining the test environment. By this approach, a matching testbench can automatically be generated for any particular instantiation of the configurable representation of the device to enable thorough verification testing of that instantiation of the device to be performed.
申请公布号 US2005004777(A1) 申请公布日期 2005.01.06
申请号 US20030743473 申请日期 2003.12.23
申请人 ARM LIMITED 发明人 HOULIHANE THOMAS SEAN
分类号 G01R31/3183;G06F17/50;(IPC1-7):G06F19/00;G01R31/00 主分类号 G01R31/3183
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