发明名称 FINFET AND METHOD FOR FORMING FIN OF FINFET TO IMPROVE ON-OFF CHARACTERISTIC AND ELECTRICAL CHARACTERISTIC
摘要 PURPOSE: A method for forming a fin of a FINFET(fin field effect transistor) is provided to improve an on-off characteristic and an electrical characteristic by making the inside of the fin have a uniform doping distribution of impurities and by reducing a variation of a threshold voltage and a subthreshold swing. CONSTITUTION: A silicon substrate(100) is prepared. An isolation layer is formed on the silicon substrate to define an active region. The active region is recessed. An in-situ doped silicon epitaxial layer is grown on the recessed active region. The isolation layer is recessed. The in-situ doped silicon epitaxial layer is trimmed. A conductive layer is formed on the silicon substrate.
申请公布号 KR20050001165(A) 申请公布日期 2005.01.06
申请号 KR20030042736 申请日期 2003.06.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, SI YOUNG;JUNG, IN SOO;LEE, BYEONG CHAN;LEE, DEOK HYUNG;SON, YONG HOON
分类号 H01L21/336;H01L21/8242;H01L21/84;H01L27/108;H01L27/12;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/336
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