FINFET AND METHOD FOR FORMING FIN OF FINFET TO IMPROVE ON-OFF CHARACTERISTIC AND ELECTRICAL CHARACTERISTIC
摘要
PURPOSE: A method for forming a fin of a FINFET(fin field effect transistor) is provided to improve an on-off characteristic and an electrical characteristic by making the inside of the fin have a uniform doping distribution of impurities and by reducing a variation of a threshold voltage and a subthreshold swing. CONSTITUTION: A silicon substrate(100) is prepared. An isolation layer is formed on the silicon substrate to define an active region. The active region is recessed. An in-situ doped silicon epitaxial layer is grown on the recessed active region. The isolation layer is recessed. The in-situ doped silicon epitaxial layer is trimmed. A conductive layer is formed on the silicon substrate.
申请公布号
KR20050001165(A)
申请公布日期
2005.01.06
申请号
KR20030042736
申请日期
2003.06.27
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
CHOI, SI YOUNG;JUNG, IN SOO;LEE, BYEONG CHAN;LEE, DEOK HYUNG;SON, YONG HOON