| 摘要 |
PROBLEM TO BE SOLVED: To provide a data transmission device and an input/output interface circuit with a jitter transmission circuit, capable of testing for jitter tolerance in data transmission/reception at the time of a mass production test and of improving a fault detection rate. SOLUTION: A clock generation circuit 5 supplies a clock signal TX_CK to a data transmission circuit 2 and supplies a clock signal RX_CK to a data reception circuit 3, for the purpose of a jitter proof test of a data transmission/reception circuit 1a. At that time, the clock signal TX_CK supplied to the data transmission circuit 2 by the clock generation circuit 5 is made to include the jitter that is depth of modulation and a modulation frequency according to each kind of setting signal. Because it is in time of the test, a signal TEST is in an H level. COPYRIGHT: (C)2005,JPO&NCIPI
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