| 摘要 |
PROBLEM TO BE SOLVED: To prevent reset from occurring during burn-in tests on flip-flop circuits with a reset function/scan function constituting a scan chain. SOLUTION: An NOR circuit is constituted of pMOSs 30 and 31 and nMOSs 32 and 33, and an invertor circuit is constituted of pMOS 34 and nMOS 35. At scan shift operation, a signal of a signal level Hi is inputted to an operation mode switching signal input terminal SE of a selector 29 to select a scan test signal of SI. An internal reset signal XR is thereby fixed to the signal level Hi regardless of an input value of a reset signal from a reset signal input terminal RST. For normal operation, a signal of a signal level Low is inputted to the operation mode switching signal input terminal SE. It is thereby possible to perform normal reset control by the reset signal impressed on the reset signal input terminal RST. COPYRIGHT: (C)2005,JPO&NCIPI
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