发明名称 X-RAY EXAMINATION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an X-ray examination apparatus capable of properly examining a subject even if the position or posture of the subject, which passes through the space between an X-ray irradiator and an X-ray line sensor, is shifted. SOLUTION: The X-ray examination apparatus is equipped with the X-ray irradiator, the X-ray line sensor, an image processing routine and an examination deciding and processing routine. The X-ray line sensor detects the X rays from the X-ray irradiator. In the image processing routine, a raw image due to X rays is subjected to image processing to form a processed image while the subject is examined on the basis of the processed image in the examination deciding and processing routine. Further, in the image processing routine, a processed image is formed through a process for extracting the boundary lines S11-S14 of the subject and a background (the outside part of the subject) from the raw image. In the examination deciding and processing routine, the inside region of the boundary lines S11-S14 of the processed image is set as a target to perform examination. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005003480(A) 申请公布日期 2005.01.06
申请号 JP20030166297 申请日期 2003.06.11
申请人 ISHIDA CO LTD 发明人 KABUMOTO TAKASHI
分类号 G01N23/04;(IPC1-7):G01N23/04 主分类号 G01N23/04
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