| 摘要 |
PROBLEM TO BE SOLVED: To provide a measuring device and a measuring method of a three-dimensional curved surface shape realizable by combining various characteristics such as high accuracy, robustness, high speed or absolute shape measurement held by a conventional technology, and a measuring method capable of simple calibration. SOLUTION: This measuring device of the three-dimensional curved surface shape is equipped with a pattern projection means 7 capable of projecting an optional pattern, an imaging means 8 for imaging a prescribed pattern projected onto the measuring object surface from the direction different from the projection direction, and a shape calculating means 50 for calculating the three-dimensional curved surface shape of the measuring object by performing image processing of the imaged pattern projection image. The projected patterns are one or more kinds of patterns, and at least one kind of a pattern among the projected patterns is a pattern comprising one or more slits, and, as for the slit pattern, the pattern shifted in the direction orthogonal to the slit is projected in a plurality of times. COPYRIGHT: (C)2005,JPO&NCIPI
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