发明名称 METHOD OF MANUFACTURING SUBSTRATE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a manufacturing method, a polishing method and a micro waviness reducing method for a substrate which reduce micro waviness of a polished object after polished in finish-polishing a memory hard disk or polishing a semiconductor device. <P>SOLUTION: The substrate manufacturing method uses a polishing fluid composition containing abrasives and water, and a polishing pad having a surface member with an average pore diameter of 0.01-35μm. The substrate polishing method uses the polishing fluid composition containing the abrasives and water, and the polishing pad having the surface member with the average pore diameter of 0.01-35μm. The substrate micro waviness reducing method uses: the polishing fluid composition containing the abrasives and water; and the polishing pad having the surface member with the average pore diameter of 0.01-35μm. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005001019(A) 申请公布日期 2005.01.06
申请号 JP20030164329 申请日期 2003.06.09
申请人 KAO CORP 发明人 OOSHIMA YOSHIAKI;NISHIMOTO KAZUHIKO;SUENAGA KENICHI;HAGIWARA TOSHIYA
分类号 B24B37/00;B82Y10/00;B82Y99/00;C09K3/14;G11B5/84;H01L21/304;(IPC1-7):B24B37/00 主分类号 B24B37/00
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