发明名称 Production method for semiconductor device
摘要 The invention aims at providing a dielectric film having a low dielectric constant and enhanced mechanical strength. A surfactant and an silica derivative are dissolved into a solvent at a desired mole ratio. The precursor solution is applied over the substrate, and the substrate is exposed to a silica derivative atmosphere before being sintered, thereby supplying a silica derivative. Thus, contraction of the film stemming from hydrolysis is inhibited, and a sturdy mesoporous silica thin film which takes the self-assembly of the surfactant as a mold is obtained while cavities are maintained intact without being fractured. Thus, there is formed an inorganic dielectric film which is formed on the surface of the substrate and has a cyclic porous structure including layered or columnar pores oriented so as to become parallel with the surface of the substrate.
申请公布号 US2005003678(A1) 申请公布日期 2005.01.06
申请号 US20040490767 申请日期 2004.03.25
申请人 NISHIYAMA NORIKAZU;UEYAMA KOREKAZU;OKU YOSHIAKI 发明人 NISHIYAMA NORIKAZU;UEYAMA KOREKAZU;OKU YOSHIAKI
分类号 H01L21/316;H01L21/768;H01L21/8246;H01L23/31;H01L23/498;H01L23/522;H01L23/532;H01L27/115;(IPC1-7):H01L21/31;H01L21/469 主分类号 H01L21/316
代理机构 代理人
主权项
地址