发明名称 WAFER CLEANING APPARATUS WITH ENHANCED STRUCTURE FOR REMOVING UNIFORMLY PARTICLES FROM EDGE AS WELL AS SURFACES OF WAFER
摘要 PURPOSE: A wafer cleaning apparatus is provided to remove uniformly particles from an edge as well as surfaces of a wafer by using an edge cleaning clamp and a brush. CONSTITUTION: A wafer cleaning apparatus includes a plurality of rotary clamps, a cleaning clamp and a brushing part. The plurality of rotary clamps(350) are arranged along an edge of a wafer(W). Each rotary clamp includes a circular groove for holding the wafer edge. The rotary clamp is capable of rotating the wafer by spinning the rotary clamp itself. The cleaning clamp(200) has the same structure as that of the rotary clamp. The cleaning clamp is used for cleaning the wafer edge. The brushing part(300) is used for cleaning a front and rear surface of the wafer.
申请公布号 KR20050000570(A) 申请公布日期 2005.01.06
申请号 KR20030041015 申请日期 2003.06.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, EUN YOUNG;KIM, JIN SUNG;PARK, HEE JUNG;PARK, JAE KOO
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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