发明名称 Semiconductor device and method of manufacture
摘要 A strained semiconductor device suitable for use in an integrated circuit and a method for manufacturing the strained semiconductor device. A mesa isolation structure is formed from a semiconductor-on-insulator substrate. A gate structure is formed on the mesa isolation structure. The gate structure includes a gate disposed on a gate dielectric material and has two sets of opposing sidewalls. Semiconductor material is selectively grown on portions of the mesa isolation structure adjacent a first set of opposing sidewalls of the gate structure and then doped. The doped semiconductor material is silicided and protected by a dielectric material. The gate is silicided wherein the silicide wraps around a second set of opposing sidewalls and stresses a channel region of the semiconductor device.
申请公布号 US2005003593(A1) 申请公布日期 2005.01.06
申请号 US20030601401 申请日期 2003.06.23
申请人 ADVANCED MICRO DEVICES, INC. 发明人 KRIVOKAPIC ZORAN
分类号 H01L21/336;H01L29/10;H01L29/423;H01L29/786;(IPC1-7):H01L21/84 主分类号 H01L21/336
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