| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for measuring the absolute shape of an object by utilizing high accuracy, robustness and high speed which are advantages of a multi-slit image encode method. SOLUTION: This measuring device of a three-dimensional curved surface shape is equipped with a pattern projection means 7 for projecting respectively a slit pattern comprising a plurality of slit light and stripe patterns comprising one or more stripe-shaped light onto the measuring object surface, an imaging means 8 for imaging the slit pattern and the stripe patterns projected onto the measuring object surface from the direction different from the projection direction, and a shape operation means 50 for operating the three-dimensional curved surface shape of the measuring object by performing image processing of the imaged pattern projection image. In the measuring device of the three-dimensional curved surface shape, the slit pattern is a pattern shifted in the direction orthogonal to the slit direction, or the plurality of stripe patterns show a code corresponding to the floodlight angle onto the position where combinations of light and shade of stripes of each pattern are projected. COPYRIGHT: (C)2005,JPO&NCIPI
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