发明名称 |
DEVICE AND METHOD FOR EXPOSING, AND POLARIZATION STATE MEASUREMENT DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide an aligner capable of determining the appropriate polarization state of illuminating light to a mask and obtaining a desired polarization state with appropriate optical adjustment as required. SOLUTION: The aligner having illuminating systems (1 to 8) for illuminating the mask (M) and exposing a pattern formed on the mask to a photosensitive plate (W) has a polarized state measuring means (9) for measuring the polarized state of the illuminating light to at least either of the mask or the photosensitive plate. The illuminating system also has a polarized state variable means (3) for varying the polarized state of the illuminating light to the mask. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005005521(A) |
申请公布日期 |
2005.01.06 |
申请号 |
JP20030168037 |
申请日期 |
2003.06.12 |
申请人 |
NIKON CORP |
发明人 |
KUDO YUJI |
分类号 |
G03F7/20;G01J4/00;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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