发明名称 PHOTOLITHOGRAPHIC METHOD, METHOD OF MANUFACTURING PIEZOELECTRIC OSCILLATING PIECE, METHOD OF MANUFACTURING PIEZOELECTRIC DEVICE, PIEZOELECTRIC OSCILLATING PIECE, SEMICONDUCTOR DEVICE, ELECTRONIC PART, PIEZOELECTRIC DEVICE, ELECTRONIC APPARATUS AND PORTABLE TELEPHONE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a photolithographic method, etc. for forming a uniform and thin resist coat formed on an electrode film of a substrate. <P>SOLUTION: The method comprises a step of coating resist grains 132b on a substrate 71 covered with an electrode film 22, a step of gasifying a solvent 146 for solving the resist grains 132b to produce an evaporation gas G of the solvent, a step of solving the resist grains 132b by the gas G of the solvent to form an electrode resist 137 on the electrode film 22 after placing the substrate 71 in the atmosphere of the solvent evaporation gas G, and a step of forming a resist pattern corresponding to an electrode pattern on the substrate 71 by exposing the electrode resist 137 formed on the electrode film 22 of the substrate 71 with a corresponding mask set on the substrate 71 to the electrode pattern. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005006013(A) 申请公布日期 2005.01.06
申请号 JP20030166837 申请日期 2003.06.11
申请人 SEIKO EPSON CORP 发明人 YOSHIHARA KATSUMI;NAKAMURA HIDEAKI
分类号 H01L41/22;H01L41/09;H01L41/23;H01L41/29;H03H3/02 主分类号 H01L41/22
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