发明名称 Test standard interfaces and architectures
摘要 In a first embodiment a TAP 318 of IEEE standard 1149.1 is allowed to commandeer control from a WSP 202 of IEEE standard P1500 such that the P1500 architecture, normally controlled by the WSP, is rendered controllable by the TAP. In a second embodiment (1) the TAP and WSP based architectures are merged together such that the sharing of the previously described architectural elements are possible, and (2) the TAP and WSP test interfaces are merged into a single optimized test interface that is operable to perform all operations of each separate test interface.
申请公布号 US2005005217(A1) 申请公布日期 2005.01.06
申请号 US20040874054 申请日期 2004.06.21
申请人 WHETSEL LEE D. 发明人 WHETSEL LEE D.
分类号 G01R31/28;G01R31/3185;G06F;(IPC1-7):G01R31/28 主分类号 G01R31/28
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