发明名称 |
SEMICONDUCTOR DEVICE WITH VOID-FREE INTERLAYER DIELECTRIC AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to suppress voids during a gap-filling process by enlarging a space between gate electrodes using a spacer removing process. CONSTITUTION: A plurality of gate electrodes(12) are formed on a substrate with a predetermined structure. A nitride layer(13) and an oxide layer(14) are sequentially deposited thereon. A spacer is formed at both sidewalls of each gate electrode by etching selectively the oxide layer. A source and drain region are formed in the substrate by implanting ions into the resultant structure using the gate electrode and spacer as a mask. The spacer is removed therefrom and an interlayer dielectric is formed thereon.
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申请公布号 |
KR20050000891(A) |
申请公布日期 |
2005.01.06 |
申请号 |
KR20030041481 |
申请日期 |
2003.06.25 |
申请人 |
DONGBUANAM SEMICONDUCTOR INC. |
发明人 |
KIM, HYUNG SEOK |
分类号 |
H01L21/335;(IPC1-7):H01L21/335 |
主分类号 |
H01L21/335 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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