发明名称 I/O cell and ESD protection circuit
摘要 An ESD protection circuit has a VDD bus, a VSS bus, an IC pad, a PMOS transistor coupled to the IC pad and the VDD bus, and an NMOS transistor coupled to the IC pad and the VSS bus. The pitch of the PMOS can smaller than the pitch of the NMOS, and the drain-contact-to-gate-spacing (DCGS) for the PMOS can be smaller than the DCGS for the NMOS.
申请公布号 US6838708(B2) 申请公布日期 2005.01.04
申请号 US20030454710 申请日期 2003.06.04
申请人 WINBOND ELECTRONICS CORP. 发明人 LIN SHI-TRON;CHEN WEI-FAN
分类号 H01L27/02;H01L29/74;H01L31/111;(IPC1-7):H01L29/74 主分类号 H01L27/02
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