发明名称 Method for making semiconductor device using a nickel film for stopping etching
摘要 In a semiconductor device, a plurality of wiring films are formed on a front surface of a base comprising an insulating resin and having electrode-forming holes, the surfaces of the wiring films and the surface of the base being positioned on the same plane and at least parts of the wiring films overlapping with the electrode-forming holes; a conductive material is embedded into the electrode-forming holes to form external electrodes on the back surface, away from the wiring films, of the base; a semiconductor element is positioned on the front surface of the base with an insulating film therebetween, the back surface of the semiconductor element being bonded to said front surface of the base; wires bond the electrodes of the semiconductor element to the corresponding wiring films; and a resin seals the wiring films and the wires.
申请公布号 US6838368(B1) 申请公布日期 2005.01.04
申请号 US20000710314 申请日期 2000.11.10
申请人 SONY CORPORATION 发明人 OHSAWA KENJI;OHDE TOMOSHI
分类号 H01L23/12;H01L21/52;H01L21/60;H01L23/00;H01L23/24;H01L23/31;H01L23/498;H01L23/60;(IPC1-7):H01L21/44 主分类号 H01L23/12
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