发明名称 POSITION DETECTING METHOD
摘要 PURPOSE:To realize a position detecting method suited for the minute material processing, by illuminating at least two areas by light among plural patterns of the material whose position shift is to be detected in order to measure the rotary shift and then deciding the position shift of other patterns based on the measurement of the rotary shift.
申请公布号 JPS53110369(A) 申请公布日期 1978.09.27
申请号 JP19770024481 申请日期 1977.03.08
申请人 发明人
分类号 H01L21/68;H01L21/50;H01L21/60 主分类号 H01L21/68
代理机构 代理人
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