发明名称 |
METHOD FOR DETECTING FOREIGN MATERIALS OF IMAGE SENSOR IN SCANNING DEVICE, AND DEVICE FOR THE SAME |
摘要 |
PURPOSE: A method for detecting foreign materials of an image sensor in scanning device, and a device for the same are provided to enhance productivity and aid performance improvement of a product through reduction of a bad ratio for a scanning device set by finding bad of the image sensor with use of a result scanning a foreign material detection chart and thresholds. CONSTITUTION: A shading part(80) performs white and black shading of the scanning device. A scanning part(84) scans the foreign material detection chart(82) including a predetermined pattern having a white level and the '1-N'th black levels. For each back level of the scanned chart, a comparator(86) respectively compares the '1-N'the brightness deviations inputted from the scanning part with the '1-N'th thresholds and outputs the compared results.
|
申请公布号 |
KR20040110663(A) |
申请公布日期 |
2004.12.31 |
申请号 |
KR20030040082 |
申请日期 |
2003.06.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HAE CHEOL |
分类号 |
G06K9/03;(IPC1-7):G06K9/03 |
主分类号 |
G06K9/03 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|