| 摘要 |
PURPOSE: A circuit for generating a power-up signal in a semiconductor device, a generating method thereof and a testing method therefor are provided to adjust and test the power-up signal level through an external control signal without any changes of circuit. CONSTITUTION: A circuit for generating a power-up signal in a semiconductor device comprises a decoder(100) for outputting plural decoding signals(tm0-tm3) according to plural address signals(Ad0-Ad1), test enable signals(tm-en) and test disable signals(tm-dis); a selection part(200) for outputting plural selecting signals(p0-p3, n0-n3) according to the plural decoding signals(tm0-tm3); a power-up signal generation part(300) for generating power-up signals(Power-up) after deciding a detection level of an external source voltage according to the plural selecting signals(p0-p3, n0-n3). The power-up signal generation part(300) consists of a voltage divider for dividing the external source voltage and generating a gate voltage signal; a detection part for deciding the detection level of the external source voltage according to the gate voltage signal and the plural selecting signals; an output part for generating the power-up signal according to an output of the detection part.
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