发明名称 SELF-ALIGNED METHOD OF FORMING AN ETCH STOPPER IN A PROCESS OF MANUFACTURING AN LCD USING A PROTRUSION PATTERN AT THE EDGE OF A GATE ELECTRODE
摘要 PURPOSE: A self-aligned method of forming an etch stopper in a process of manufacturing an LCD(Liquid Crystal Display) is provided to dispense with a separate apparatus and a separate process for back exposure, thereby simplifying the manufacturing process by using a protrusion pattern at the edge of a gate electrode. CONSTITUTION: A gate material layer is formed on a transparent insulating substrate(31). A gate electrode(33) having a protrusion pattern(33a) is formed by selectively etching the gate material layer. A gate insulating layer(35) and an amorphous silicon layer are formed on the resultant substrate successively. A photoresist pattern is formed on the amorphous silicon layer by coating, exposing through a reticle(41) and developing a photoresist layer(39). In case of front exposure of the photoresist layer, the photoresist pattern is formed in a self-aligned method by the light scattered and reflected on the protrusion pattern of the gate electrode. The photoresist pattern is used as an etch stopper.
申请公布号 KR20040110796(A) 申请公布日期 2004.12.31
申请号 KR20030040254 申请日期 2003.06.20
申请人 BOE HYDIS TECHNOLOGY CO., LTD. 发明人 CHOI, HYEON MUK;CHOI, SEUNG JIN;JUNG, BONG GWAN;KIM, GI YONG
分类号 G02F1/136;(IPC1-7):G02F1/136 主分类号 G02F1/136
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