发明名称 TAPE CARRIER TYPE SEMICONDUCTOR DEVICE ENABLING DEFECTIVENESS DETECTION BY NAKED EYES AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A tape carrier type semiconductor device and a manufacturing method thereof are provided to enable a determination of a defectiveness of a semiconductor element with naked eyes by providing holes or targets inside of an outer shape region. CONSTITUTION: A tape carrier type semiconductor device includes a plurality of predetermined interconnection patterns and a plurality of semiconductor elements sequentially arranged on a long flexible insulating tape. Each of the semiconductor elements includes either a hole(8) or a target mark(7) inside of an outer shape region(6). The hole is bored to indicate that the semiconductor device is a non-defective one. The target mark is not bored to indicate that the semiconductor device is a defective one.
申请公布号 KR20040111102(A) 申请公布日期 2004.12.31
申请号 KR20040044895 申请日期 2004.06.17
申请人 SHARP CORPORATION 发明人 INOMO, KEIICHI;IWANE, TOMOHIKO
分类号 H01L21/60;H01L23/495;H01L23/544;(IPC1-7):H01L21/60 主分类号 H01L21/60
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