发明名称 |
TAPE CARRIER TYPE SEMICONDUCTOR DEVICE ENABLING DEFECTIVENESS DETECTION BY NAKED EYES AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A tape carrier type semiconductor device and a manufacturing method thereof are provided to enable a determination of a defectiveness of a semiconductor element with naked eyes by providing holes or targets inside of an outer shape region. CONSTITUTION: A tape carrier type semiconductor device includes a plurality of predetermined interconnection patterns and a plurality of semiconductor elements sequentially arranged on a long flexible insulating tape. Each of the semiconductor elements includes either a hole(8) or a target mark(7) inside of an outer shape region(6). The hole is bored to indicate that the semiconductor device is a non-defective one. The target mark is not bored to indicate that the semiconductor device is a defective one. |
申请公布号 |
KR20040111102(A) |
申请公布日期 |
2004.12.31 |
申请号 |
KR20040044895 |
申请日期 |
2004.06.17 |
申请人 |
SHARP CORPORATION |
发明人 |
INOMO, KEIICHI;IWANE, TOMOHIKO |
分类号 |
H01L21/60;H01L23/495;H01L23/544;(IPC1-7):H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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