发明名称 SELECTIVE SILICON-ON-INSULATOR ISOLATION STRUCTURE AND METHOD
摘要 A first aspect of the present invention is a method of forming an isolation structure including: (a) providing a semiconductor substrate; (b) forming a buried N-doped region in the substrate; (c) forming a vertical trench in the substrate, the trench extending into the N-doped region; (d) removing the N-doped region to form a lateral trench communicating with and extending perpendicular to the vertical trench; and (e) at least partially filling the lateral trench and filling the vertical trench with one or more insulating materials.
申请公布号 US2004262695(A1) 申请公布日期 2004.12.30
申请号 US20030604102 申请日期 2003.06.26
申请人 发明人 STEEGAN AN L.;SURENDRA MAHESWARAN;WANN HSING-JEN;ZHANG YING;ZACH FRANZ;WONG ROBERT
分类号 H01L21/336;H01L21/76;H01L21/8234;H01L21/8238;H01L21/8242;H01L21/84;H01L27/12;H01L29/76;H01L31/062;(IPC1-7):H01L29/76 主分类号 H01L21/336
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