发明名称 Bump structure of a semiconductor wafer and manufacturing method thereof
摘要 A bump structure is applicable for disposing above a semiconductor wafer, which has a plurality of bonding pads and a passivation exposing the bonding pads on which a plurality of patterned under bump metallurgy layers are formed. It is characterized that the bump structure is made of a first bump and a second bump, and the bump structure is disposed on one of the patterned under bump metallurgy layer wherein the second bump covers the first bump and the melting point of the second bump is below the melting point of the first bump. In addition, a manufacturing method of the bump structure is provided.
申请公布号 US2004266066(A1) 申请公布日期 2004.12.30
申请号 US20040874239 申请日期 2004.06.24
申请人 ADVANCED SEMICONDUCTOR ENGINEERING, INC. 发明人 WANG TONG HONG
分类号 H01L21/60;H01L23/485;(IPC1-7):H01L21/44 主分类号 H01L21/60
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