发明名称 Methods for forming a gap filling layer using high density plasma
摘要 Methods of forming a gap filling layer using high density plasma are disclosed. A disclosed method comprises directing at least one gas for ILD deposition and at least one gas for etching into a chamber containing a substrate having at least one predetermined structure; depositing a first ILD over the substrate until a thickness of the first ILD reaches a predetermined thickness; suspending supply of the gas for ILD deposition into the chamber; removing at least one part of the first ILD; re-starting the supply of the gas for ILD deposition into the chamber; and depositing a second ILD on the first ILD
申请公布号 US2004266218(A1) 申请公布日期 2004.12.30
申请号 US20040877726 申请日期 2004.06.25
申请人 KWON YOUNG MIN 发明人 KWON YOUNG MIN
分类号 H01L21/205;C23C16/04;C23C16/40;H01L21/316;H01L21/768;(IPC1-7):H01L21/476;H01L21/31;H01L21/469 主分类号 H01L21/205
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