发明名称 |
Methods for forming a gap filling layer using high density plasma |
摘要 |
Methods of forming a gap filling layer using high density plasma are disclosed. A disclosed method comprises directing at least one gas for ILD deposition and at least one gas for etching into a chamber containing a substrate having at least one predetermined structure; depositing a first ILD over the substrate until a thickness of the first ILD reaches a predetermined thickness; suspending supply of the gas for ILD deposition into the chamber; removing at least one part of the first ILD; re-starting the supply of the gas for ILD deposition into the chamber; and depositing a second ILD on the first ILD
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申请公布号 |
US2004266218(A1) |
申请公布日期 |
2004.12.30 |
申请号 |
US20040877726 |
申请日期 |
2004.06.25 |
申请人 |
KWON YOUNG MIN |
发明人 |
KWON YOUNG MIN |
分类号 |
H01L21/205;C23C16/04;C23C16/40;H01L21/316;H01L21/768;(IPC1-7):H01L21/476;H01L21/31;H01L21/469 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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