| 摘要 |
<p>The present invention is referred to a device for effectively cleaning tips of a scanning tunnelling microscope (STM) probe in ultra high vacuum comprising means for bombarding (11, 20, 21, 22) a tip (1) with an electron beam, to a microscope as above specified including the latter a cleaning process for tips of a scanning tunnelling microscope probe in ultra high vacuum comprising the steps of: transferring a tip (1) on an insulated housing system (6); approaching a conducting filament (20) to said tip; applying a predetermined current to said conducting filament (20); applying a predetermined voltage between said conducting filament (20) and said tip (1) to be cleaned for a predetermined time, whereby said tip (1) is subject to an electron flux.</p> |
