发明名称 |
METHOD AND EQUIPMENT FOR INSPECTING ELECTRIC CHARACTERISTICS OF SPECIMEN |
摘要 |
<p>A method and equipment for inspecting the electric characteristics of a specimen W in which the electrode of the specimen W and a probe (12A) are brought into contact reliably and stably with a constant overdrive amount at all times. The method and equipment is characterized in that the height of a load detecting mechanism (17) is measured using a length measuring mechanism (16), a first lift of the load detecting mechanism (17) from the measuring position thereof to a point to start contact with the probe (12A) is determined, the height of the electrode of the specimen W is measured using the length measuring mechanism (16), and a second lift of a main chuck (11) up to the point to start contact with the probe (12A) is determined based on the difference in the measured height between the electrode of the specimen W and the load detecting mechanism (17).</p> |
申请公布号 |
WO2004114392(A1) |
申请公布日期 |
2004.12.29 |
申请号 |
WO2004JP08292 |
申请日期 |
2004.06.08 |
申请人 |
KOMATSU, SHIGEKAZU;TOKYO ELECTRON LIMITED |
发明人 |
KOMATSU, SHIGEKAZU |
分类号 |
G01R31/28;G01R1/06;H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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