发明名称 SEMICONDUCTOR DEVICE AND PRODUCTION METHOD THEREFOR
摘要 <p>A semiconductor device provided with a MIS field effect transistor comprising a silicon substrate, a gate insulation film provided on this silicon substrate via a silicon-containing insulation film and having a high-permittivity metal oxide film, a silicon-containing gate electrode formed on this gate insulation film, and a side wall including, as a constitution member, silicon oxide on the side surface side of this gate electrode, wherein a silicon nitride film is interposed between this side wall and at least the side surface of the gate electrode. This semiconductor device, although having a fine structure with a small gate length, is capable of low power-consumption and fast operation.</p>
申请公布号 WO2004114390(A1) 申请公布日期 2004.12.29
申请号 WO2004JP05997 申请日期 2004.04.26
申请人 NEC CORPORATION;OGURA, TAKASHI;IKARASHI, NOBUYUKI;IWAMOTO, TOSHIYUKI;WATANABE, HIROHITO 发明人 OGURA, TAKASHI;IKARASHI, NOBUYUKI;IWAMOTO, TOSHIYUKI;WATANABE, HIROHITO
分类号 H01L21/28;H01L29/51;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/28
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