发明名称 PROCESS AND APPARATUS FOR REACTIVE ION ETCHING
摘要 Process and apparatus for use in extracting negative ions from a plasma which is particularly useful in reactive ion etching of metals, silicon and oxides and nitrides of silicon in the manufacture of semiconductor devices. A magnetic field is employed in the apparatus and, herein, is created by a novel grid, through which negative ions pass to a surface, such as one to be etched, while free electrons are prevented from passing through the grid and out of the plasma. The novel process utilizes negative ions which have a large fraction in the atomic state.
申请公布号 DE2861385(D1) 申请公布日期 1982.01.28
申请号 DE19782861385 申请日期 1978.12.13
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 KELLER, JOHN HOWARD;MC KENNA, CHARLES MICHAEL
分类号 H01J27/14;H01J37/08;H01J37/305;H01L21/302;(IPC1-7):H01J37/30;H01J37/05 主分类号 H01J27/14
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