发明名称 |
METHOD FOR PRODUCING SEMICONDUCTOR SINGLE CRYSTAL WAFER AND LASER PROCESSING DEVICE USED THEREFOR |
摘要 |
<p>A method for producing semiconductor single crystal wafer is characterized i n that a plurality of semiconductor single crystal wafers (2a-2d) having a relatively small diameter that is required by prospective consumers are cut out of a semiconductor single crystal wafer (1a-1d) having a relatively larg e diameter. This method has a secondary advantage in that even when a semiconductor singly crystal wafer of large-diameter partially has a defect, some semiconductor single crystal wafers of small-diameter can be cut out fo r shipment from the portion other than the region with the defect.</p> |
申请公布号 |
CA2508733(A1) |
申请公布日期 |
2004.12.29 |
申请号 |
CA20042508733 |
申请日期 |
2004.06.10 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
OTSUKI, MAKOTO;NISHIKAWA, MASAYUKI;MATSUI, YASUYUKI |
分类号 |
B23K26/40;B28D1/22;B28D5/00;C30B29/40;C30B33/00;H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
B23K26/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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