Method for testing an electronic component,申请号EP20020010478-传众专利搜索

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发明名称	Method for testing an electronic component
摘要
申请公布号	EP1361450(B1)	申请公布日期	2004.12.29
申请号	EP20020010478	申请日期	2002.05.08
申请人	INFINEON TECHNOLOGIES AG	发明人	CHEE HONG, LIAU, ERIC
分类号	G01R31/30;G11C29/50;G11C29/56;(IPC1-7):G01R31/30;G11C29/00	主分类号	G01R31/30
代理机构		代理人
主权项
地址

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