发明名称 Inductively coupled plasma system
摘要 An inductively coupled plasma apparatus is provided, wherein the inductively coupled plasma apparatus includes a process chamber having a wafer susceptor on which a substrate is installed, a top plasma source chamber which is installed on the process chamber, a reactor, which is installed in the top plasma source chamber, having a channel through which a gas flows, wherein the reactor supplies plasma reaction products to the process chamber, an inductor, having two ends, is installed between the top plasma source chamber and the reactor and is wound around the reactor, an opening which is positioned within a circumferential space in which the inductor is installed between the reactor and the process chamber, and a shutter operable to open and close the opening. Thus, a uniform radial distribution of radicals emanating from a plasma source can be improved.
申请公布号 US6835919(B2) 申请公布日期 2004.12.28
申请号 US20020259393 申请日期 2002.09.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 TOLMACHEV YURI NIKOLAEVICH;MA DONG-JOON;MOON CHANG-WOOK;YOON HEA-YOUNG
分类号 H05H1/46;B01J19/08;C23C16/505;H01J37/32;H01L21/205;H01L21/31;(IPC1-7):H05B1/02 主分类号 H05H1/46
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