| 摘要 |
In a guiding apparatus for positionally accurate docking of a testing head for electronic components to a handler or prober, a guiding pin is provided, arranged to be displaceable in a direction normal to its longitudinal direction on an attachment block attached on a testing head or handler/prober. Within the attachment block, a taper pin is provided longitudinally displaceable and carrying a taper tip on its end facing the guiding pin. The guiding pin has a centering recess on its side facing the taper pin. The taper tip can be brought into and out of engagement with the centering recess, wherein by inserting the taper tip into the centering recess a predetermined position of the guiding pin with respect to the attachment block, and therefore with respect to that device, which carries the guiding pin, can be achieved.
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