| 摘要 |
The invention concerns a method and an arrangement (10, 20) for the contact-free inspection and measurement of the surface features and surface defects of surfaces (23) of materials. In order to achieve this, a line (22) of light is projected onto a surface (23) of the material. The reflection (24, 35, 38, 52, 54) of the line of light form the surface of the material is recorded by an optical arrangement (20, 55, 90) with a two-dimensional image sensor (36) that comprises rows of pixels. The optical arrangement (20, 55, 90) comprises means (26, 28, 32, 40, 42, 44) for the separation of the reflected line of light in at least two images (22c, 22d, 22e, 22f, 22g, 22h) of the line of light, whereby at least one of the images of the line of light is derived from specularly reflected light. Furthermore, an addition is achieved column by column for each of the images (22c, 22d, 22e, 22f, 22g, 22h) of the line of light. A difference image (22c-b) is calculated column by column between the added powers of light recorded through at least two of the images (22c, 22d, 22e, 22f, 22g, 22h) of the line of light. The difference is used of at least one of the calculation of the gradient for the determination of defects (60, 62, 64, 70) in the surface and the distinction between the diffuse image and gloss of the said surface of the material column by column along the line (22) of light that is projected onto the surface (23) of the material. |
