发明名称 Semiconductor integrated circuit device with a plurality of limiter circuits
摘要 A semiconductor integrated circuit device, which is intended to prevent the characteristic degradation, includes multiple limiter circuits which are laid out by being scattered across a semiconductor substrate to produce an internal power voltage of a certain voltage level. Each limiter circuit is laid out so as to have its transistor formation area located just beneath the formation area of a bump electrode which puts in an externally supplied power voltage. The scattered layout of limiter circuits avoids the concentration of current to one limiter circuit and alleviates the harmful heat-up of the limiter circuits and their periphery. The shorter wiring length from the bump electrode to the transistor results in a smaller wiring resistance, alleviating the power voltage drop on the wiring.
申请公布号 US6835971(B2) 申请公布日期 2004.12.28
申请号 US20030355006 申请日期 2003.01.31
申请人 RENESAS TECHNOLOGY CORP.;HITACHI ULSI SYSTEMS CO., LTD. 发明人 TOYOSHIMA HIROSHI;HAYASHI ATSUHIRO;NEGISHI TAKEMI;UEHARA TAKASHI
分类号 G11C11/413;G11C11/41;H01L21/822;H01L21/8244;H01L23/528;H01L23/60;H01L25/04;H01L25/18;H01L27/04;H01L27/11;(IPC1-7):H01L27/10;H01L23/52 主分类号 G11C11/413
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