发明名称 Method for fabricating semiconductor device
摘要 After forming, on a substrate, a first insulating film with a relatively low dielectric constant and low mechanical strength, the first insulating film is patterned. After forming, on the substrate, a second insulating film with a relatively high dielectric constant and high mechanical strength, the second insulating film is planarized by polishing, so as to form a thinned portion of the second insulating film on the patterned first insulating film. An interconnect groove is formed in the thinned portion of the second insulating film and the patterned first insulating film, and then, a buried interconnect is formed in the interconnect groove.
申请公布号 US6835645(B2) 申请公布日期 2004.12.28
申请号 US20010942907 申请日期 2001.08.31
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 IKURA TSUNEO
分类号 H01L21/44;H01L21/4763;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/44
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