| 摘要 |
FIELD: flaw detection. ^ SUBSTANCE: device for detecting surface defects in material with partially reflecting surface has at least one light source disposed in such a manner to direct incident light onto surface of reflecting material and light receiver disposed above surface of material. Light source 29 and at least one source (23, 23') are disposed relatively each other in such a way that in case of absence of surface defect F in material 27, light from light source (23, 23') is not caught by detector 29 and if there is surface defect F in material 27, light from at least one light source(23, 23') is reflected from defect F to detector 29. ^ EFFECT: high rate of detecting of defects. ^ 25 cl, 4 dwg |
