| 摘要 |
An accelerated test method for testing an integrated circuit is described. The accelerated test method has the following steps. First, test vector data is taken as input to the integrated circuit to produce response data as output. Next, a one-way-hash function is used to transform the response data into a test message digest. Next, the test message digest is verified against a standard message digest to determine whether the test message digest meet a predetermined requirement. The one-way-hash function is embedded as part of the BIST circuit in the integrated circuit or implemented within automated test equipment.
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