| 摘要 |
The present invention relates to a dual sensitivity eddy current test probe for inspecting a tubular member made of electrically conducting material in order to detect and localize defects in the tubular member, comprising a probe body for movement about a surface of the tubular member, a first test coil assembly for detecting and localizing defects within the tubular member, a first support for the first test coil assembly, a second test coil assembly for acquiring historical data about defects in the tubular member, a second support for the second test coil assembly, and a magnetic coupling interference eliminating system interposed between the first and second test coil assemblies. The first support is mounted on the probe body for holding the first test coil assembly at a first predetermined distance from the surface of the tubular member while the probe body moves about this surface of the tubular member. In the same manner, the second support is mounted on the probe body for holding the second test coil assembly at a second predetermined distance from the surface of the tubular member while the probe body moves about that surface of the tubular member.
|
