发明名称 Sample carrier for carrying a sample to be irradiated with an electron beam
摘要 Sample carriers for use in Transmission Electron Microscopes (TEMs) and freely commercially available have the form of a gauze with a strengthening edge. The thickness of these known sample carriers is of the order of magnitude of 20 mum, and is uniform across the entire sample holder. The tiny thickness of these fragile sample carriers makes manipulation difficult. There is a desire to realize automatic introduction and removal of sample carriers in a TEM, seeing as this would make it possible to use the TEM continuously, without human intervention. The invention describes a robust sample carrier whereby-both in the case of manual and automatic manipulation-deformation of and/or damage to the sample carrier is avoided. This is achieved by employing a strengthening edge portion 2 with a thickness 6 larger than the thickness 5 of the middle portion 1 of the sample carrier. The ability to use the sample carrier in analyses in which tilting is important is hereby not impeded.
申请公布号 US2004256570(A1) 申请公布日期 2004.12.23
申请号 US20040870617 申请日期 2004.06.17
申请人 FEI COMPANY 发明人 WAGNER RAYMOND;VAN DE WATER GERBERT JEROEN
分类号 G01N1/00;G01N1/28;H01J37/20;(IPC1-7):G01N21/00 主分类号 G01N1/00
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