发明名称 ANGLED IMPLANT FOR TRENCH ISOLATION
摘要 A trench isolation having a sidewall and bottom implanted region located within a substrate of a first conductivity type is disclosed. The sidewall and bottom implanted region is formed by an angled implant, a 90 degree implant, or a combination of an angled implant and a 90 degree implant, of dopants of the first conductivity type. The sidewall and bottom implanted region located adjacent the trench isolation reduces surface leakage and dark current.
申请公布号 WO2004081989(A3) 申请公布日期 2004.12.23
申请号 WO2004US07510 申请日期 2004.03.12
申请人 MICRON TECHNOLOGY, INC.;RHODES, HOWARD, E.;MOULI, CHANDRA 发明人 RHODES, HOWARD, E.;MOULI, CHANDRA
分类号 H01L;H01L21/00;H01L21/265;H01L21/76;H01L21/762;H01L21/768;H01L27/146;H01L31/062 主分类号 H01L
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