发明名称 |
CIRCUIT AND METHOD FOR TESTING HIGH SPEED DATA CIRCUITS |
摘要 |
A circuit and method are described in which a DC voltage or current is connected to a high frequency, AC-coupled signal path between a transmitter and a receiver, and the bit error rate of the data transmission is tested while applying an altered bias voltage to the received signal. The bias voltage can be connected via a resistor, inductor or transistors. The transmitted signal is attenuated resistively, and a load capacitance is applied whose value causes digital transition times to exceed one unit interval. An intended application is testing of an integrated circuit, serializer/deserializer (serdes) operating above 1 GHz. |
申请公布号 |
WO2004061459(A3) |
申请公布日期 |
2004.12.23 |
申请号 |
WO2003US38648 |
申请日期 |
2003.12.05 |
申请人 |
LOGICVISION (CANADA), INC.;SUNTER, STEPHEN, K.;ROY, AUBIN, P. J. |
发明人 |
SUNTER, STEPHEN, K.;ROY, AUBIN, P. J. |
分类号 |
G01R31/28;G01R31/317;G01R31/3185 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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