发明名称 Lithographic apparatus, projection system, method of projecting and device manufacturing method
摘要 A projection system includes at least one projection device configured to receive a beam of radiation coming from a first object and project the beam to a second object. The projection system further includes a sensor configured to measure a spatial orientation of the at least one projection device and a processing unit configured to communicate with the at least one sensor. The processing unit is configured to communicate with a positioning device configured to adjust the position of at least one of the first object and the second object based on the measured spatial orientation of the at least one projection device.
申请公布号 US2004257549(A1) 申请公布日期 2004.12.23
申请号 US20040823772 申请日期 2004.04.14
申请人 ASML NETHERLANDS B.V. 发明人 LEENDERS MARTINUS HENDRIKUS ANTONIUS;COX HENRIKUS HERMAN MARIE;LEVASIER LEON MARTIN
分类号 G02F1/13;F16F15/02;G03F7/20;G03F9/00;H01L21/027;(IPC1-7):G03B27/42 主分类号 G02F1/13
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