发明名称 |
Whole-substrate spectral imaging system for CMP |
摘要 |
Systems of and methods for capturing a plurality of one-dimensional images representative of substantially all of the surface of a substrate within a single revolution of a rotating platen holding a polishing pad in operative contact with the surface of the substrate during chemical-mechanical planarization. A two-dimensional image comprising frame data, which may comprise a spectral image, is derived from the plurality of one-dimensional images. The frame data provides information useful for subsequent chemical-mechanical processing of the substrate.
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申请公布号 |
US2004259472(A1) |
申请公布日期 |
2004.12.23 |
申请号 |
US20040815555 |
申请日期 |
2004.04.01 |
申请人 |
CHALMERS SCOTT A.;GEELS RANDALL S.;BIBBY THOMAS F.A. |
发明人 |
CHALMERS SCOTT A.;GEELS RANDALL S.;BIBBY THOMAS F.A. |
分类号 |
B24B37/013;B24B37/04;B24B49/12;(IPC1-7):B24B49/00 |
主分类号 |
B24B37/013 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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