发明名称 |
Method for fabricating a semiconductor product with a memory area and a logic area |
摘要 |
A method for the integration of field-effect transistors for memory and logic applications in a semiconductor substrate is disclosed. The gate dielectric and a semiconductor layer are deposited over the whole area both in the logic region and in the memory region. From these layers, the gate electrodes in the memory region are formed, the source and drain regions are implanted and the memory region is covered in a planarizing manner with an insulation material. Afterward, the gate electrodes are formed from the semiconductor layer and the gate dielectric in the logic region.
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申请公布号 |
US2004259298(A1) |
申请公布日期 |
2004.12.23 |
申请号 |
US20040485308 |
申请日期 |
2004.08.03 |
申请人 |
GRAF WERNER;KIESLICH ALBRECHT |
发明人 |
GRAF WERNER;KIESLICH ALBRECHT |
分类号 |
H01L21/8239;H01L21/8242;H01L27/105;(IPC1-7):H01L21/336;H01L21/823 |
主分类号 |
H01L21/8239 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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