发明名称 A resist composition
摘要 This invention relates to a polymer capable of forming an ultra-fine pattern with excellent rectangular shape in a silylated surface resolution process using a chemically amplified type resist composition as single layer or the most upper layer among multiple layers and to a resist composition using the polymer. The said polymer and resist composition are useful in a silylated surface resolution process, and by conducting the silylated surface resolution process using the said resist composition, contrast of silylation becomes higher and it becomes possible to obtain ultra-fine pattern regardless of the kind of exposure energy.
申请公布号 EP1059314(B1) 申请公布日期 2004.12.22
申请号 EP20000112208 申请日期 2000.06.07
申请人 WAKO PURE CHEMICAL INDUSTRIES, LTD. 发明人 HUJIE, HIROTOSHI;MAESAWA, TSUNEAKI;MORI, YASUYOSHI
分类号 C08F8/12;C08F212/14;G03F7/004;G03F7/039 主分类号 C08F8/12
代理机构 代理人
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