发明名称 REDUCTION PROJECTION EXPOSURE DEVICE
摘要 PURPOSE:To obtain a device, on which a reduction projection lens having high resolving power is loaded and which can transfer an element pattern having a large area by using one photo-mask, by installing a reticule stage, to which a reticule having a large area can be mounted and can be positioned at an arbitrary position. CONSTITUTION:A reticule stage 5, on which a reticule 3 having a region larger than a transferable region in a reduction projection lens 6 can be loaded, and a means positioning the reticule stage 5 so as to be able to position the predetermined regions for patterns drawn on the reticule 3 into the transferable region are provided. A pattern such as an element pattern 4 having an area larger than the projectable area of a reduction projection exposure device is divided into plural sections and drawn onto the reticule 3, and reticule alignment marks 4-5 are formed in response to each divided pattern 4-1-4-4. The patterns 4-1-4-4 are positioned respectively into an exposure region, and transferred gradually in succession, thus transferring the element pattern having a large area.
申请公布号 JPS63107023(A) 申请公布日期 1988.05.12
申请号 JP19860251637 申请日期 1986.10.24
申请人 HITACHI LTD 发明人 TERASAWA TSUNEO;KUROSAKI TOSHISHIGE;KAWAMURA YOSHIO;MORIYAMA SHIGEO
分类号 G03F9/00;H01L21/027;H01L21/30 主分类号 G03F9/00
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