发明名称 Probe assembly for detecting an ion in a plasma generated in an ion source
摘要 A method and apparatus relating to an ion implantation system that employs an ion source for generating a plasma having an ion, and a probe assembly for detecting the ion of the plasma is provided. The probe assembly includes a probe body and a focusing device for extracting the ion from the plasma, and a filter for filtering ions extracted from the plasma.
申请公布号 US6833710(B2) 申请公布日期 2004.12.21
申请号 US20010966604 申请日期 2001.09.27
申请人 AXCELIS TECHNOLOGIES, INC. 发明人 BENVENISTE VICTOR M.
分类号 H01J27/02;H01J37/08;H01J37/32;(IPC1-7):G01N27/62;G01K1/08 主分类号 H01J27/02
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